SeniorStaff Engineer, Test Solutions Engineering
Job Summary
Our vision is to transform how the world uses information to enrich life for all.
Join an inclusive team passionate about one thing: using their expertise in the relentless pursuit of innovation for customers and partners. The solutions we build help make everything from virtual reality experiences to breakthroughs in neural networks possible. We do it all while committing to integrity sustainability and giving back to our communities. Because doing so can fuel the very innovation we are pursuing.
Job Description
As a Senior/Staff Test Solutions Engineer (HBM Probe) at Micron you will take full ownership of developing debugging and delivering wafer/cube probe test solutions for High Bandwidth Memory (HBM) devices across the product lifecyclefrom new product introduction (NPI) through high-volume manufacturing (HVM).
You are expected to drive fast learning cycles during early silicon ensure probe readiness for downstream processes and deliver test solutions that meet aggressive targets on yield quality and cost. This role requires strong accountability in problem-solving decision-making and execution working across global cross-functional teams to drive outcomes.
Job Responsibilities
HBM Probe Test Development & Ownership
- Own end-to-end development and delivery of wafer/cube probe test solutions for HBM devices
- Define and drive probe test plans including coverage strategy defect screening and test time targets
- Develop debug and release ATE test programs with full accountability for quality and manufacturability
- Ensure test solutions are robust scalable and aligned to NPI and production requirements
Silicon Debug & Root Cause Closure
- Take ownership of complex wafer/cube probe failures and drive deep debug across silicon test program and hardware domains
- Lead root cause analysis using data failure signatures and cross-domain insights (Design DFT Process Test)
- Drive end-to-end issue closure ensuring corrective actions are validated and sustained in production
Data Analysis Yield & Learning Acceleration
- Own probe data analysis to identify yield gaps parametric shifts and defect mechanisms
- Drive fast learning cycles by converting probe insights into actionable improvements for downstream processes
- Make data-driven decisions to optimize test coverage guardbands and release readiness
NPI Execution & Production Readiness
- Own probe bring-up for first silicon and drive readiness for characterization and qualification
- Ensure smooth transition of probe solutions into downstream flows and high-volume manufacturing
- Proactively identify risks and gaps and drive mitigation plans to meet program milestones
Probe Hardware & System Accountability
- Own interaction between probe test programs and hardware (probe cards load boards probers)
- Drive resolution of hardware-software interaction issues impacting stability accuracy and throughput
- Ensure probe setups are optimized and validated for both engineering and production usage
Cost Test Time & Efficiency Delivery
- Take ownership of probe test time and cost targets driving continuous optimization without compromising quality
- Balance coverage vs. efficiency trade-offs and make decisions aligned to product and business needs
- Identify and implement innovations to improve probe productivity and cost effectiveness
Cross-Functional Leadership
- Drive alignment across Design DFT Product Engineering and Manufacturing to resolve probe-related challenges
- Influence early design and testability decisions to improve overall product quality and test efficiency
- Act as a key technical point of contact ensuring clear communication and decisive execution across global teams
Technical Leadership & Capability Building
- Mentor engineers and elevate team capability in probe test development debug methodologies and data analysis
- Drive adoption of best-known methods (BKMs) and standardization of probe practices
- Share technical learnings and insights to strengthen organizational knowledge and execution
Requirements
- Bachelors degree in electrical or Electronics Engineering (or equivalent)
- Hands-on experience in semiconductor test engineering preferably in wafer/cube probe or ATE environments
- Strong foundation in product testing and semiconductor fundamentals
- Experience in memory products (e.g. HBM DRAM) or high-speed digital devices
- Strong analytical thinking problem-solving and silicon debug capabilities
- Experience in test program development debug and data-driven decision making
- Proven ability to take ownership and drive results in a cross-functional fast-paced environment
- Experience in NPI characterization and production ramp execution
About Micron Technology Inc.
We are an industry leader in innovative memory and storage solutions transforming how the world uses information to enrich lifefor all. With a relentless focus on our customers technology leadership and manufacturing and operational excellence Micron delivers a rich portfolio of high-performance DRAM NAND and NOR memory and storage products through our Micron and Crucial brands. Every day the innovations that our people create fuel the data economy enabling advances in artificial intelligence and 5G applications that unleash opportunities from the data center to the intelligent edge and across the client and mobile user experience.
To learn more please visit qualified applicants will receive consideration for employment without regard to race color religion sex sexual orientation gender identity national origin veteran or disability status.
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Micron Prohibits the use of child labor and complies with all applicable laws rules regulations and other international and industry labor standards.
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Required Experience:
Staff IC
About Company
Explore Micron Technology, leading in semiconductors with a broad range of performance-enhancing memory and storage solutions