SoC Hard IP Characterization Product Engineer
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Job Location:
Austin, TX - USA
Monthly Salary:
Not Disclosed
Posted on:
30+ days ago
Vacancies:
1 Vacancy
Job Summary
- Characterize parametric performance of High Speed IO PHYs (SERDES) PLLs Sensors and other Custom HardIPs.- Define characterization plans perform statistical data analysis drive ATE-Bench correlation & data reviews across cross-functional teams and sign off on all silicon characterization activities.- Work with DFT and design teams to evaluate IP testability and drive new silicon debug.- Perform failure analysis to root-cause issues implement corrective actions and qualify cutting edge process technologies.- Work with Design Validation Test engineering DFT Program Management and Manufacturing to support productization of next generation SoCs.- Complete yield and correlation analysis for all test insertions and support test time reduction related characterization activities.
- Bachelors degree 3 Years of Experience.
- Understanding of Test and characterization of High-Speed IO PHYs PLLs Sensors and related electrical specifications (eye diagrams JTOL signal integrity de-embedding etc.) mixed-signal IPs.
- Experience working with Digital Mixed Signal SOC Devices and a solid understanding of ATE production testing. Hands on ATE and/or Bench experience is a plus.
- Statistical data analysis tools to perform high volume characterization & production data analysis.
- High Speed Digital and Analog circuits Design for Test and Manufacturing Concepts.
- Experience in scripting (Python PERL etc.) is a plus.
Key Skills
- Dhcp
- Active Directory
- VMware
- ASA
- Solarwinds
- Access Points
- F5
- Load Balancers
- QoS
- Nexus
- Routers
- Windows
- Visio
- Hsrp
- Dns
About Company
Ask Siri to name the most successful company in the world and it might respond: Apple. And it's not just out of familial pride. Apple consistently ranks highly in profit, revenue, market capitalization, and consumer cachet. In 2018, the company became the first reach a trillion dollar ... View more
