Intrinsic Reliability Lead Head – Semiconductor Device Reliability

• Location: Dholera / Ahmedabad Gujarat India
• Work Mode: Onsite
• Experience: 15 Years

Lead the development of semiconductor intrinsic and product reliability capability for a new semiconductor manufacturing organization. Responsible for establishing reliability laboratories defining reliability methodologies driving qualification programs and building high-performing reliability teams. This role requires deep expertise in semiconductor device failure mechanisms accelerated testing reliability modelling and technology qualification.

• Define intrinsic and product-level reliability requirements.
• Establish and operationalize reliability laboratories and testing infrastructure.
• Procure and qualify reliability test and monitoring equipment.
• Develop standardized reliability test procedures and methodologies.
• Support R&D and technology transfer programs through reliability analysis.
• Lead intrinsic and product reliability qualification strategies.
• Develop reliability models for device aging and degradation.
• Analyze semiconductor failure mechanisms and qualification data.
• Build and lead global cross-functional reliability teams.
• Drive customer confidence through reliability assurance programs.
• Present reliability results to executive leadership and customers.
• Support new technology introduction and manufacturing qualification.

• M.S. or PhD in Physics Electrical Engineering Materials Science or related discipline.
• 15 years of semiconductor industry experience.
• Proven experience establishing advanced semiconductor reliability laboratories.
• Strong background in intrinsic device reliability and product reliability.

• Intrinsic Reliability
• Product Reliability
• Device Reliability
• Reliability Qualification

• Hot Carrier Injection (HCI)
• Time Dependent Dielectric Breakdown (TDDB)
• Negative Bias Temperature Instability (NBTI)
• Electromigration (EM)
• Stress Migration (SM)

• HTOL
• HTRB
• HTGB
• Accelerated Reliability Testing
• Reliability Monitoring

• Aging Models
• Lifetime Prediction
• Reliability Statistics
• Design of Experiments (DOE)