Silicon Debug Engineer
Austin, TX - USA
Job Summary
Imagine yourself at the center of our SoC bring-up and product ramp effort collaborating across circuit design process engineering DFT and failure analysis teams with a critical impact on getting functional products to millions of customers quickly.
Drive the silicon debug effort involving custom circuits from initial bring-up through volume ramp owning failure isolation from symptom to root with circuit design teams to define silicon characterization and debug requirements for test chips and product with PE / DFT / FA teams to plan and execute electrical and physical characterization design analysis modeling/simulation SPICE simulation statistical analysis and silicon bring-up to understand and reproduce failure closely with systems and lab teams to reproduce circuit-level behavior using MBIST functional diagnostics and characterization and interpret FA analysis translating electrical failure signatures into targeted physical analysis strategies and understanding how FA technique choices impact observable circuit eFA and pFA techniques including Dynamic Laser Stimulus (DLS) Lock-in Thermography (LIT) Nanoprobe Focused Ion Beam (FIB) TEM/SEM EMMI and Physical Failure Analysis (PFA) to identify defect mechanisms and localize failures to specific circuit the circuit impact of FA techniques including how photon emission voltage contrast charge injection sample preparation and probe-induced perturbations may influence or mask failure modes during analysis.
BSEE/MSEE
Experience in one or more of the following areas: SRAM circuits custom circuit design silicon in design or debug of low-voltage / low-power custom understanding of deep-submicron device physics leakage mechanisms and technology interactions with device understanding of device matching device noise sources (1/f thermal) extrinsic noise sources (supply noise jitter) and their impact on high-precision with electrical failure analysis (eFA) techniques and physical failure analysis (pFA) workflows and the ability to plan FA strategies based on electrical debug of Dynamic Lock-in Thermography (DLS) and Lock-in Thermography (LIT) for localization of resistive and leakage defects including their sensitivity limits and how thermal signatures correlate to specific circuit fault of Nanoprobe techniques for electrical probing of deep-submicron nodes and appreciation of how probe contact voltage bias and electron beam exposure can perturb sensitive analog or memory of how physical sample preparation steps (deprocessing FIB cross-section delayering) can alter or destroy evidence of electrical failures and how to coordinate FA plans that preserve failure to interpret FA results (photon emission maps OBIRCH thermal maps TEM/SEM imagery) in the context of circuit topology and failure electrical to conduct structured experiments during silicon debug gather and analyze large datasets and utilize scripting to support efficient handling of debug in scripting languages (Python Perl or others) and CAD automation of industry-standard circuit design and simulation tools.
Required Experience:
IC
About Company
Ask Siri to name the most successful company in the world and it might respond: Apple. And it's not just out of familial pride. Apple consistently ranks highly in profit, revenue, market capitalization, and consumer cachet. In 2018, the company became the first reach a trillion dollar ... View more